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| Contributors | |
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| Preface | |
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| Future Contributions | |
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| Signposts in Electron Optics | |
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| Background | |
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| Charged-Particle Optics | |
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| Aberrations | |
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| Aberration Correction | |
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| Monochromators | |
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| Wave Optics | |
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| Image Algebra | |
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| References | |
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| Introduction to Crystallography | |
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| Introduction to Crystal Symmetry | |
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| Diffraction from a Lattice | |
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| References | |
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| Convergent Beam Electron Diffraction | |
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| Introduction | |
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| More Advanced Topics | |
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| Bibliography | |
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| References | |
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| High-Resolution Electron Microscopy | |
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| Basic Principles of Image Formation | |
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| The Electron Microscope | |
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| Interpretation of the Images | |
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| Quantitative HREM | |
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| Precision and Experimental Design | |
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| Future Developments | |
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| References | |
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| Structure Determination through Z-Contrast Microscopy | |
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| Introduction | |
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| Quantum Mechanical Aspects of Electron Microscopy | |
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| Theory of Image Formation in the STEM | |
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| Examples of Structure Determination by Z-Contrast Imaging | |
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| Practical Aspects of Z-Contrast Imaging | |
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| Future Developments | |
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| Summary | |
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| References | |
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| Electron Holography of Long-Range Electromagnetic Fields: A Tutorial | |
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| Introduction | |
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| General Considerations | |
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| The Magnetized Bar | |
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| Electrostatic Fields: A Glimpse at Charged Microtips and Reverse-Biased p-n Junctions | |
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| Conclusion | |
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| References | |
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| Electron Holography: A Powerful Tool for the Analysis of Nanostructures | |
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| Electron Interference | |
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| Electron Coherence | |
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| Electron Wave Interaction with Object | |
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| Conventional Electron Microscopy (TEM) | |
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| Electron Holography | |
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| Summary | |
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| Suggested Reading | |
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| References | |
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| Crystal Structure Determination from EM Images and Electron Diffraction Patterns | |
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| Solution of Unknown Crystal Structures by Electron Crystallography | |
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| The Two Steps of Crystal Structure Determination | |
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| The Strong Interaction between Electrons and Matter | |
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| Determination of Structure Factor Phases | |
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| Crystallographic Structure Factor Phases in EM Images | |
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| The Relation between Projected Crystal Potential and HRTEM Images | |
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| Recording and Quantification of HRTEM Images and SAED Patterns for Structure Determination | |
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| Extraction of Crystallographic Amplitudes and Phases from HRTEM Images | |
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| Determination of and Compensation for Defocus and Astigmatism | |
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| Determination of the Projected Symmetry of Crystals | |
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| Interpretation of the Projected Potential Map | |
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| Quantification of and Compensation for Crystal Thickness and Tilt | |
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| Crystal Structure Refinement | |
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| Extension of Electron Crystallography to Three Dimensions | |
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| Conclusion | |
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| References | |
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| Direct Methods and Applications to Electron Crystallography | |
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| Introduction | |
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| The Minimal Prior Information | |
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| Scaling of the Observed Intensities | |
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| The Normalized Structure Factors and Their Distributions | |
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| Two Basic Questions Arising from the Phase Problem | |
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| The Structure Invariants | |
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| A Typical Phasing Procedure | |
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| Direct Methods for Electron Diffraction Data | |
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| References | |
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| Strategies in Electron Diffraction Data Collection | |
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| Introduction | |
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| Method to Improve the Dynamic Range of Charge-Coupled Device (CCD) Cameras | |
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| ELD and QED: Two Software Packages for ED Data Processing | |
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| The Three-Dimensional Merging Procedure | |
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| The Precession Technique | |
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| Conclusion | |
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| References | |
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| Advances in Scanning Electron Microscopy | |
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| Introduction | |
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| The Classical SEM | |
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| Advances in the Design of the SEM Column | |
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| Specimen Environment and Signal Detection | |
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| References | |
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| On the Spatial Resolution and Nanoscale Feature Visibility in Scanning Electron Microscopy | |
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| Introduction | |
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| Backscattered Electron Imaging | |
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| Secondary Electron Imaging | |
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| BSE-to-SE Conversion | |
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| Conclusion | |
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| References | |
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| Nanoscale Analysis by Energy-Filtering TEM | |
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| Introduction | |
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| Elemental Mapping | |
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| Quantitative Analysis of ESI Series | |
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| Mapping of ELNES | |
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| Conclusion | |
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| References | |
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| Ionization Edges: Some Underlying Physics and Their Use in Electron Microscopy | |
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| Introduction | |
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| Elastic and Inelastic Collisions | |
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| Counting the Elastic and Inelastic Events | |
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| Transitions to the Unoccupied States | |
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| Electron-Atom Interaction | |
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| Orientation Dependence | |
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| Orders of Magnitude | |
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| Mixed Dynamic Form Factor | |
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| Examples of Applications | |
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| Images | |
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| Conclusion | |
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| Appendix | |
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| References | |
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| Index | |
