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Images of Materials

Williams, David B.; Pelton, Alan R.; Gronsky, Ronald
ISBN-10: 0195058569
ISBN-13: 9780195058567

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4 new & used from $4.91
This spectacularly illustrated book celebrates the structural beauty of everyday materials and the space-age technologies used to probe their surface features and internal structures. It introduces the reader to the various instruments and their uses: scanning electron, ion, and tunneling microscopies, acoustic microscopy and transmission electron microscopy.
The book describes how images are processed and analyzed, and how modern materials science is based on these techniques and their ability to "see" materials at the atomic level. The book includes hundreds of illustrations and 32 pages of beautiful color plates depicting the complex microscopic realm within such everyday materials as the metals used in cars and planes, polymer fabrics, ceramics, and the ubiquitous silicon semiconductors, without which society today would fall into disarray and confusion. The many full-color and black-and-white illustrations make this book a pleasure for the eye, in addition to being a useful resource for scientists, students, researchers, and engineers involved in solid-state physics, materials science, geology, and chemistry."Almost a necessity for anyone involved in metallography." --Choice"An excellent resource. The fine images will provide a visual vocabularyfor the microscopies covered (SEM, TEM, STM, scanning-ion, light, and acousticmicroscopy). The text too is well judged, having a lighter and smoother tonethan a textbook. Principles and ideas are indicated without complexity ormathematics. The microscopists who produced this beautiful book should be proudof it. Those who did not contribute to it should buy it or produce a rival bookof their own." --Microscopy Research and Technique"An exceptional collection of 12 chapters describing several types andtechniques of microscopy that are the basis of modern microstructural analysisin materials science. Although each of the topics covered is broad, the authorshave generally provided complete introductions, with numerous examples showingthe present state of the art. With their extensive references, the chaptersalso serve as a guide to further information . . . All of the chapters arewritten in a clear style well suited to the nonexpert reader . . . . This bookindeed provides a delightful view into the world of materials." --Science"A valuable resource for all microscopists, or prospective microscopists,who wish to learn more about the bewildering range of techniques currentlyavailable. . . .The standard of reproduction of micrographs is extremely highand the layout is attractive. . . .This is the most comprehensive introductionto modern microscopy currently available. . . . The beauty of many of themicrographs reproduced here demonstrates the aesthetic as well as the scientificrewards which can be gained by looking ever more closely at the materials whichsurround us." --Inst. of Materials Journal"A wide range of examples of each technique us given. The quality of themicrographs is outstanding. . . . include some spectacular reflected-lightmicrographs . . . as well as false-colour images made by techniques such aselectron probe and SIMS element mapping and STM. The black and white micrographsare also of a very high standard." --Journal of Microscopy"Good concise descriptions, written by people who know their stuff. Youwill find a lot of pictures, many of them very informative and taken with agreat deal of skill. You will most probably find something to interest you -- Idid. The subject matter of this book is thus of great importance." --PeterGoodhew, Materials and Design"It has many characteristics of a text or reference book surveying thecurrently available microscopy techniques for the imaging of structures inmaterials. At the same time, as the editors suggest, it 'celebrates the beautyof the structures of the materials-' with its superb reproduction of theimages." --Microscopy Society of American Bulletin"The authors . . . are eminently qualified to represent their fields,reviewing a selection of microscopy-based techniques available to the materialsscientist . . . . The production quality of the book is excellent, as is thereproduction of micrographs." --New Scientist"Todays' fine-structure imaging . . . is remarkably many-sided. Each ofthe dozen chapters in this books is a state-of-the-art overview of one pictorialdiscipline by an expert author or a small group. Their welcome practice is tobreak off some highly technical explication full of acronyms and urge thenonspecialist reader to attend instead to the images overleaf. The level of thetext remains demanding; this is a resource for materials scientists, but openedfor others through its uncommon visuals. Virtuosity abounds." --ScientificAmerican"You will find good concise descriptions, written by people who know theirstuff, of convergent beam electron diffraction and atom probe field ionmicroscopy amnd aspects of image processing and high-resolution TEM. You willfind a lot of pictures, many of them very informative and taken with ahgreatdeal of skill." --Engineering Structures and Materials and Design1. G.F. Vander Voort: Imaging by Light Optical Microscopy 2. D.C. Joy and J.I. Goldstein: Scanning Electron Microscopy 3. R. Levi-Setti, et al.: Analytical Imaging With A Scanning Ion Microprobe 4. G.A.D. Briggs and M. Hoppe: Acoustic Microscopy 5. G. Thomas: Transmission Electron Microscopy 6. D.B. Williams and K.S. Vecchio: Electron Diffraction Images 7. R. Gronsky: Atomic Resolution Microscopy 8. S. Chiang and R.J. Wilson: Surface Imaging by Scanning Tunneling Microscopy 9. M.K. Miller and M.G. Burke: Atom Probe Field-Ion Microscopy: Imaging at the Atomic Level 10. D.E. Newbury, et al.: Compositional Mapping of the Microstructure of Materials 11. D.S. Bright, et al.: Processing Images and Selecting Regions of Interest 12. J.C. Russ: Image Analysis of the Microstructure of Materials
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Imaging by Light Optical Microscopy
Scanning Electron Microscopy
Analytical Imaging With A Scanning Ion Microprobe
Acoustic Microscopy
Transmission Electron Microscopy
Electron Diffraction Images
Atomic Resolution Microscopy
Surface Imaging by Scanning Tunneling Microscopy
Atom Probe Field-Ion Microscopy: Imaging at the Atomic Level
Compositional Mapping of the Microstructure of Materials
Processing Images and Selecting Regions of Interest
Image Analysis of the Microstructure of Materials




List price: $110.00
Edition: 1991
Publisher: Oxford University Press, Incorporated
Binding: Trade Cloth
Pages: 394
Size: 8.46" wide x 11.02" long x 0.50" tall
Weight: 3.63 lbs.
Language: English

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