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Characterization and Metrology for ULSI Technology 2000 International Conference

Seiler, David G.; Diebold, Alain C.; Shaffner, Thomas J.; McDonald, Robert; Bullis, W. Murray
ISBN-10: 156396967X
ISBN-13: 9781563969676

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New  $186.80
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Used (Very Good) $3.61+ $2.99 shipping
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